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Expose NI SystemLink test data to AI for quality and asset analysis.
Copy the install command and let the AI configure it · recommended for beginners
No copy-paste install info for "systemlink-mcp" yet — see the docs or source repo.
Using NI SystemLink data, summarize test yield for each product revision and sort from lowest to highest.
A yield summary by product revision, ranked to highlight underperforming revisions.
Analyze failed DUT test steps, identify which steps exceed specification limits, and note the related limits.
A mapping of failing steps to their spec-limit violations to support troubleshooting.
Summarize the key characteristics of recent measurement traces and list assets that are due for calibration.
A concise measurement-trace summary plus a list of assets due for calibration.
Test engineers or analysts can expose SystemLink test data to AI and quickly compare yield across product revisions. This helps surface revisions or batches that need investigation.
When a device under test fails, users can use this tool to examine failing steps against specification limits. It is useful for pinpointing which steps are out of spec.
Teams that monitor measurement results or equipment readiness can use it to get measurement-trace summaries and identify calibration-due assets. This supports earlier calibration and maintenance planning.
It exposes NI SystemLink test-and-measurement data to AI clients through MCP. Known capabilities include yield by product revision, failed DUT steps versus spec limits, measurement-trace summaries, and calibration-due assets.
From the provided information, it is an MCP tool that connects to NI SystemLink data. For exact installation steps, authentication requirements, or runtime details, see the source repository.
It is focused on the test domain rather than generic data access. The description specifically mentions domain tools for yield, failing steps versus spec limits, measurement-trace summaries, and calibration-due assets.
Monitor industrial process data and get anomaly analysis with actionable recommendations.
Control NI oscilloscopes with AI for acquisition, measurement, and configuration.
Run tests programmatically, inspect results, and get test strategy recommendations.
Control STM32 boards via J-Link RTT for logs, memory, and flashing.
Verify receipts, check platform status, and simulate infrastructure attacks.
Debug embedded devices, flash firmware, and diagnose crashes through J-Link probes.